Multifunctional Laser Ellipsometer-WJZ-II

The thickness of the film was measured using a spectrometer as a platform. Use software for data processing.

Classification:

Spectrometer series

Key words:

Message

Description

Experiment content:
Measure film thickness.
Measure the refractive index of the medium.
Verify Marius's law.
Observe and understand the polarization of light.
Instrument features:
The thickness of the film was measured using a spectrometer as a platform.
Use software for data processing.
Complete set of equipment:
Semiconductor lasers, digital galvanometers, photoelectric probes,
Main technical indicators:
Measurement of transparent film thickness range 0-300nm,
Refractive index 1.30-2.49.
The scale range of polarizer, analyzer and 1/4 wave plate is 0-360
Vernier reading 0.1 °
Measurement accuracy: ± 2nm.
Incident angle y1 = 70 °,K9 glass refractive index n = 1.515.
Extinction coefficient: 0, air refractive index 1.
Semiconductor laser wavelength λ = 635nm.
Sample to be tested, polarizer, analyzer, spectrometer
(optional) etc.