Light intensity distribution tester-TWGZ-I

Experiment content:
Determination of one-dimensional light intensity distribution of diffraction and interference patterns such as monofilament, double slit and multi-slit.
Instrument features:
A comprehensive experimental system for the observation and determination of interference diffraction such as single slit, multi-slit, moment hole, round hole, etc.
Measure the width of a single seam.
Small hole, small screen, moment hole, double hole, grating and orthogonal grating diffraction, interference phenomenon demonstration experiment. The effect of slit width variation on diffraction fringes was observed.
Main technical indicators:
The length of the guide rail is 1200mm.
Semiconductor laser, input voltage: DC = 3V,
Wavelength: λ = 635nm.
Complete set of equipment:
Precision guide rail, semiconductor laser, one-dimensional light intensity test device, small hole slit plate, grating plate, adjustable slit, photoelectric probe, small hole white screen, multi-function optical signal analyzer, etc.
Adjustable slit width 0~1mm (continuously adjustable).
One-dimensional light intensity distribution measurement distance> 80mm,
Minimum reading: 0.01mm.
A variety of interference diffraction elements with different specifications are integrated on the aperture slit plate and grating plate.
Equipped with GX-I multi-function optical signal analyzer.